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    Defect Related Leakage Current Components in SiC Schottky Barrier Diode

    New search for: Ohtsuka, K.
    New search for: Nakatani, T.
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    New search for: Fujihira, K.
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    New search for: Yamada-Kaneta, H.
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    Defect Related Leakage Current Components in SiC Schottky Barrier Diode

    New search for: Ohtsuka, K.
    New search for: Nakatani, T.
    New search for: Nagae, A.
    New search for: Watanabe, H.
    New search for: Nakaki, Y.
    New search for: Fujii, Y.
    New search for: Fujihira, K.
    New search for: Nakata, S.
    New search for: Yutani, N.
    New search for: Yamada-Kaneta, H.
    New search for: Sakai, A.

    Access

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    Defect Related Leakage Current Components in SiC Schottky Barrier Diode

    New search for: Ohtsuka, K.
    New search for: Nakatani, T.
    New search for: Nagae, A.
    New search for: Watanabe, H.
    New search for: Nakaki, Y.
    New search for: Fujii, Y.
    New search for: Fujihira, K.
    New search for: Nakata, S.
    New search for: Yutani, N.
    New search for: Yamada-Kaneta, H.
    New search for: Sakai, A.

    Access

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    Document information
    Title:

    Defect Related Leakage Current Components in SiC Schottky Barrier Diode

    Contributors:

    Ohtsuka, K. (author) / Nakatani, T. (author) / Nagae, A. (author) / Watanabe, H. (author) / Nakaki, Y. (author) / Fujii, Y. (author) / Fujihira, K. (author) / Nakata, S. (author) / Yutani, N. (author) / Yamada-Kaneta, H.

    Published in:

    Defects-Recognition, Imaging and Physics in Semiconductors XIV ; 53-56

    MATERIALS SCIENCE FORUM ; 725

    Publication date:

    2012-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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