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Microstructural variation and high-speed impact responses of Sn–3.0Ag–0.5Cu/ENEPIG solder joints with ultra-thin Ni–P deposit
Microstructural variation and high-speed impact responses of Sn–3.0Ag–0.5Cu/ENEPIG solder joints with ultra-thin Ni–P deposit
Microstructural variation and high-speed impact responses of Sn–3.0Ag–0.5Cu/ENEPIG solder joints with ultra-thin Ni–P deposit
Ho, C. Y. (author) / Duh, J. G. (author) / Lin, C. W. (author) / Lin, C. J. (author) / Wu, Y. H. (author) / Hong, H. C. (author) / Wang, T. H. (author)
JOURNAL OF MATERIALS SCIENCE ; 48 ; 2724-2732
2013-01-01
9 pages
Article (Journal)
English
DDC:
620.11
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