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Zr–Ti–Ni thin film metallic glass as a diffusion barrier between copper and silicon
Zr–Ti–Ni thin film metallic glass as a diffusion barrier between copper and silicon
Zr–Ti–Ni thin film metallic glass as a diffusion barrier between copper and silicon
Wang, C. W. (author) / Yiu, P. (author) / Chu, J. P. (author) / Shek, C. H. (author) / Hsueh, C. H. (author)
JOURNAL OF MATERIALS SCIENCE ; 50 ; 2085-2092
2015-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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