Ge-on-insulator wafer with ultralow defect density fabricated by direct condensation of SiGe-on-insulator structure

Ye, L. / Zhang, M. / Xue, Z. et al. | British Library Online Contents | 2015

Strain evolution of SiGe-on-insulator fabricated by germanium condensation method with over-oxidation

Lin, Guangyang / Lan, Xiaoling / Chen, Ningli et al. | British Library Online Contents | 2016

Strain evolution in SiGe-on-insulator fabricated by a modified germanium condensation technique with gradually reduced condensation temperature

Lin, Guangyang / Liang, Dongxue / Wang, Jiaqi et al. | British Library Online Contents | 2019

Relaxed SiGe-on-insulator fabricated by dry oxidation of sandwiched Si/SiGe/Si structure

Di, Z. / Zhang, M. / Liu, W. et al. | British Library Online Contents | 2005

Seebeck Coefficient of Ge-on-Insulator Layers Fabricated by Direct Wafer Bonding Process

Manimuthu, V. / Yoshida, S. / Suzuki, Y. et al. | British Library Conference Proceedings | 2015