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    PIEZOELECTRIC MATERIAL COMPOSITION, METHOD OF MANUFACTURING THE SAME,PIEZOELECTRIC DEVICE, AND APPARATUS INCLUDING THE PIEZOELECTRIC DEVICE

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    A piezoelectric material composition may be represented by Equation 1. A piezoelectric device may include a piezoelectric device layer including the piezoelectric material composition represented by Equation 1, a first electrode disposed at a first surface of the piezoelectric device layer, and a second electrode disposed at a second surface different from the first surface of the piezoelectric device layer.a⁢PbZrO3-b⁢PbTiO3-(1-a-b)⁢Pb(Nic⁢Nb1-c)⁢O3+x⁢mol⁢%⁢A+y⁢vol⁢%⁢BaTiO3[Equation⁢1]where A is Fe2O3, Co2O3, Mn2O3, ZnO, GeO2, CuO, or NiO, and 0.15≤a≤0.24, 0.29≤b≤0.38, 0.30≤c≤0.35, 0.00≤x≤3.00, and 0.00≤y≤7.00.

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    PIEZOELECTRIC MATERIAL COMPOSITION, METHOD OF MANUFACTURING THE SAME,PIEZOELECTRIC DEVICE, AND APPARATUS INCLUDING THE PIEZOELECTRIC DEVICE

    New search for: KO SUNGWOOK
    New search for: PARK SEUNGRYULL
    New search for: NAHM SAHN
    New search for: KIM JUNGSOO
    New search for: LEE GEUN-SOO
    New search for: KIM EUNJI

    A piezoelectric material composition may be represented by Equation 1. A piezoelectric device may include a piezoelectric device layer including the piezoelectric material composition represented by Equation 1, a first electrode disposed at a first surface of the piezoelectric device layer, and a second electrode disposed at a second surface different from the first surface of the piezoelectric device layer.a⁢PbZrO3-b⁢PbTiO3-(1-a-b)⁢Pb(Nic⁢Nb1-c)⁢O3+x⁢mol⁢%⁢A+y⁢vol⁢%⁢BaTiO3[Equation⁢1]where A is Fe2O3, Co2O3, Mn2O3, ZnO, GeO2, CuO, or NiO, and 0.15≤a≤0.24, 0.29≤b≤0.38, 0.30≤c≤0.35, 0.00≤x≤3.00, and 0.00≤y≤7.00.

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    PIEZOELECTRIC MATERIAL COMPOSITION, METHOD OF MANUFACTURING THE SAME,PIEZOELECTRIC DEVICE, AND APPARATUS INCLUDING THE PIEZOELECTRIC DEVICE

    New search for: KO SUNGWOOK
    New search for: PARK SEUNGRYULL
    New search for: NAHM SAHN
    New search for: KIM JUNGSOO
    New search for: LEE GEUN-SOO
    New search for: KIM EUNJI

    A piezoelectric material composition may be represented by Equation 1. A piezoelectric device may include a piezoelectric device layer including the piezoelectric material composition represented by Equation 1, a first electrode disposed at a first surface of the piezoelectric device layer, and a second electrode disposed at a second surface different from the first surface of the piezoelectric device layer.a⁢PbZrO3-b⁢PbTiO3-(1-a-b)⁢Pb(Nic⁢Nb1-c)⁢O3+x⁢mol⁢%⁢A+y⁢vol⁢%⁢BaTiO3[Equation⁢1]where A is Fe2O3, Co2O3, Mn2O3, ZnO, GeO2, CuO, or NiO, and 0.15≤a≤0.24, 0.29≤b≤0.38, 0.30≤c≤0.35, 0.00≤x≤3.00, and 0.00≤y≤7.00.

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    Title:

    PIEZOELECTRIC MATERIAL COMPOSITION, METHOD OF MANUFACTURING THE SAME,PIEZOELECTRIC DEVICE, AND APPARATUS INCLUDING THE PIEZOELECTRIC DEVICE

    Contributors:

    KO SUNGWOOK (author) / PARK SEUNGRYULL (author) / NAHM SAHN (author) / KIM JUNGSOO (author) / LEE GEUN-SOO (author) / KIM EUNJI (author)

    Publication date:

    2025-03-06

    Type of media:

    Patent

    Type of material:

    Electronic Resource

    Language:

    English

    Classification:

    IPC:  H10N / C04B Kalk , LIME

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