Non-destructive characterisation of doped Si and SiGe epilayers using FTIR spectroscopic ellipsometry (FTIR-SE)

Pickering, C. / Leong, W. Y. / Glasper, J. L. et al. | British Library Online Contents | 2002

Photoreflectance versus ellipsometry investigation of GaAs/Al~0~.~3Ga~0~.~7As MQW's

Bellani, V. / Borghesi, A. / Geddo, M. et al. | British Library Online Contents | 1993

Spectroscopic ellipsometry

British Library Online Contents | 2005

Photoreflectance, Reflectivity and Photoluminescence of MOVPE grown ZnSe/GaAs epilayers and ZnSeS/ZnSe superlattices

Boemare, C. / Nazare, M. H. / Taudt, W. et al. | British Library Online Contents | 1995

In situ real time ellipsometry monitoring during GaN epilayers processing

Losurdo, M. / Capezzuto, P. / Bruno, G. | British Library Online Contents | 1999