Electrical Characterization of Metastable Defects Introduced in GaN by Eu-Ion Implantation

Auret, F.D. / Meyer, W.E. / Diale, M. et al. | British Library Online Contents | 2011

Electrical and structural characterization of defects introduced in p-SiGe during low energy erbium implantation

Mamor, M. / Pipeleers, B. / Auret, F. D. et al. | British Library Online Contents | 2003

Study of Defects Generated by Standard- and Plasma-Implantation of Nitrogen Atoms in 4H-SiC Epitaxial Layers

Ottaviani, L. / Kazan, M. / Biondo, S. et al. | British Library Online Contents | 2012

Deep Defects in 3C-SiC Generated by H^+- and He^+-Implantation or by Irradiation with High-Energy Electrons

Weidner, M. / Trapaidze, L. / Pensl, G. et al. | British Library Online Contents | 2010

ESR characterization of defects produced in diamond surface by B ion implantation

Show, Y. / Matsuoka, F. / Izumi, T. et al. | British Library Online Contents | 1997