Electrical and Optical Characterization of Defects in Gan Generated by Ion Implantation: Fid-Bau Portal

Electrical and Optical Characterization of Defects in Gan Generated by Ion Implantation

Haase, D. / Burkard, M. / Schmid, M. / Doernen, A. / Schweizer, H. / Bolay, H. / Scholz, F.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Electrical and Optical Characterization of Defects in Gan Generated by Ion Implantation

Haase, D. / Burkard, M. / Schmid, M. / Doernen, A. / Schweizer, H. / Bolay, H. / Scholz, F.

Electrical and Optical Characterization of Defects in Gan Generated by Ion Implantation

Haase, D. / Burkard, M. / Schmid, M. / Doernen, A. / Schweizer, H. / Bolay, H. / Scholz, F.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Electrical and Optical Characterization of Defects in Gan Generated by Ion Implantation

Contributors:

Haase, D. (author) / Burkard, M. (author) / Schmid, M. (author) / Doernen, A. (author) / Schweizer, H. (author) / Bolay, H. (author) / Scholz, F. (author)

Published in:

MATERIALS SCIENCE FORUM ; 258/263 ; 1093-1098

Publication date:

1997-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Auret, F.D. / Meyer, W.E. / Diale, M. et al. | British Library Online Contents | 2011

Electrical and structural characterization of defects introduced in p-SiGe during low energy erbium implantation

Mamor, M. / Pipeleers, B. / Auret, F. D. et al. | British Library Online Contents | 2003

Study of Defects Generated by Standard- and Plasma-Implantation of Nitrogen Atoms in 4H-SiC Epitaxial Layers

Ottaviani, L. / Kazan, M. / Biondo, S. et al. | British Library Online Contents | 2012

ESR characterization of defects produced in diamond surface by B ion implantation

Show, Y. / Matsuoka, F. / Izumi, T. et al. | British Library Online Contents | 1997

Deep Defects in 3C-SiC Generated by H^+- and He^+-Implantation or by Irradiation with High-Energy Electrons

Weidner, M. / Trapaidze, L. / Pensl, G. et al. | British Library Online Contents | 2010