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High efficiency photoresist-free lithography of UO~3 patterns from amorphous films of uranyl complexes
High efficiency photoresist-free lithography of UO~3 patterns from amorphous films of uranyl complexes
High efficiency photoresist-free lithography of UO~3 patterns from amorphous films of uranyl complexes
Gao, M. (Autor:in) / Hill, R. H. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 13 ; 1379-1389
01.01.1998
11 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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Photoresist-free lithography of 3 m wide UO~3 lines from amorphous films of uranyl complexes
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