Structural Characterisation of Er Implanted, Ge-Rich SiO~2 Layers Using Slow Positron Implantation Spectroscopy

Anwand, W. / Kanjilal, A. / Brauer, G. et al. | British Library Online Contents | 2011

Characterization of vacancy-type defects in Al^+ and N^+ co-implanted SiC by slow positron implantation spectroscopy

Anwand, W. / Brauer, G. / Coleman, P.G. et al. | British Library Online Contents | 1999

Rutherford backscattering/channeling study of the implanted MeV Au^+ in silicon

Wang, K.-M. / Meng, M.-Q. / Lu, F. et al. | British Library Online Contents | 1999

Rutherford backscattering studies of solid phase recrystallization and incorporation in erbium-implanted silicon

Li, D.-Q. / Ren, T.-Q. / Gong, B.-A. et al. | British Library Online Contents | 1995

Slow Positron Implantation Spectroscopy of Insulators: Charging Effects

Coleman, P. G. / Kuna, S. / Grynszpan, R. | British Library Online Contents | 1997