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Evolution of vacancy-like defects in helium-implanted (100) silicon studied by thermal desorption spectrometry
Evolution of vacancy-like defects in helium-implanted (100) silicon studied by thermal desorption spectrometry
Evolution of vacancy-like defects in helium-implanted (100) silicon studied by thermal desorption spectrometry
Corni, F. (Autor:in) / Calzolari, G. (Autor:in) / Gambetta, F. (Autor:in) / Nobili, C. (Autor:in) / Tonini, R. (Autor:in) / Zapparoli, M. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 71 ; 207 - 212
01.01.2000
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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