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Structural Characterization of Silicon Carbide Etched by Using a Combination of Ion Implantation and Wet Chemical Etching
Structural Characterization of Silicon Carbide Etched by Using a Combination of Ion Implantation and Wet Chemical Etching
Structural Characterization of Silicon Carbide Etched by Using a Combination of Ion Implantation and Wet Chemical Etching
Henkel, T. (Autor:in) / Ferro, G. (Autor:in) / Nishizawa, S. (Autor:in) / Pressler, H. (Autor:in) / Tanaka, Y. (Autor:in) / Tanoue, H. (Autor:in) / Kobayashi, N. (Autor:in)
MATERIALS SCIENCE FORUM ; 338/342 ; 481-484
01.01.2000
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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