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Measurement and Device Simulation of Avalanche Breakdown in High-Voltage 4H-SiC Diodes Including the Influence of Macroscopic Defects
Measurement and Device Simulation of Avalanche Breakdown in High-Voltage 4H-SiC Diodes Including the Influence of Macroscopic Defects
Measurement and Device Simulation of Avalanche Breakdown in High-Voltage 4H-SiC Diodes Including the Influence of Macroscopic Defects
Domeij, M. (Autor:in) / Brunahl, H. (Autor:in) / Ostling, M. (Autor:in)
MATERIALS SCIENCE FORUM ; 389/393 ; 1277-1280
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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