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Observation of Planar Defects in 2-inch SiC Wafer
Observation of Planar Defects in 2-inch SiC Wafer
Observation of Planar Defects in 2-inch SiC Wafer
Tanaka, H. (Autor:in) / Nishiguchi, T. (Autor:in) / Sasaki, M. (Autor:in) / Nishino, S. (Autor:in)
MATERIALS SCIENCE FORUM ; 389/393 ; 79-82
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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