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Observation of Planar Defects in 2-inch SiC Wafer
Observation of Planar Defects in 2-inch SiC Wafer
Observation of Planar Defects in 2-inch SiC Wafer
Tanaka, H. (author) / Nishiguchi, T. (author) / Sasaki, M. (author) / Nishino, S. (author)
MATERIALS SCIENCE FORUM ; 389/393 ; 79-82
2002-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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