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Observation of ion-induced changes in the channel current of high electron mobility AlGaN/GaN transistors (HEMT)
Observation of ion-induced changes in the channel current of high electron mobility AlGaN/GaN transistors (HEMT)
Observation of ion-induced changes in the channel current of high electron mobility AlGaN/GaN transistors (HEMT)
Neuberger, R. (Autor:in) / Muller, G. (Autor:in) / Eickhoff, M. (Autor:in) / Ambacher, O. (Autor:in) / Stutzmann, M. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 93 ; 143 - 146
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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