A C-V Method of Slow-Switching Interface Traps Identification in Silicon Carbide MOS Structures

Gutt, T. / Przewlocki, H.M. / Bakowski, M. | British Library Online Contents | 2010

Effect of interface traps on Debye thickness semiconductor films

Sandomirsky, V. / Butenko, A. V. / Kolobov, I. G. et al. | British Library Online Contents | 2006

Simulation study of interface traps and bulk traps in n^+^+GaN/InAlN/AlN/GaN high electron mobility transistors

Molnar, M. / Donoval, D. / Kuzmik, J. et al. | British Library Online Contents | 2014

Simulation study of interface traps and bulk traps in n^+^+GaN/InAlN/AlN/GaN high electron mobility transistors

Molnar, M. / Donoval, D. / Kuzmik, J. et al. | British Library Online Contents | 2014

Investigation of Deep Interface Traps in Very-Thin Oxide/Si Structures Prepared at Low Temperatures Using Chemical Solutions

Rusnak, J. / Ruzinsky, M. / Imamura, K. et al. | British Library Online Contents | 2009