Raman study of strained SiGe layers

Gu, S. / Zhang, R. / Han, P. et al. | British Library Online Contents | 1994

Electrical characterization of low temperature deposited TiO2 films on strained-SiGe layers

Dalapati, G. K. / Chatterjee, S. / Samanta, S. K. et al. | British Library Online Contents | 2003

Bandgap narrowing in strained SiGe on the basis of electrical measurements on Si/SiGe/Si hetero bipolar transistors

Eberhardt, J. / Kasper, E. | British Library Online Contents | 2002

Compressively strained Ge channels on relaxed SiGe buffer layers

Bollani, M. / Muller, E. / Signoretti, S. et al. | British Library Online Contents | 2003

Strain relaxation of strained-Si layers on SiGe-on-insulator (SGOI) structures after mesa isolation

Usuda, K. / Mizuno, T. / Tezuka, T. et al. | British Library Online Contents | 2004