Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Fabrication of Double Implanted (0001) 4H-SiC MOSFETs by using Pyrogenic Re-Oxidation Annealing
Fabrication of Double Implanted (0001) 4H-SiC MOSFETs by using Pyrogenic Re-Oxidation Annealing
Fabrication of Double Implanted (0001) 4H-SiC MOSFETs by using Pyrogenic Re-Oxidation Annealing
Kosugi, R. (Autor:in) / Kiritani, N. (Autor:in) / Suzuki, K. (Autor:in) / Yatsuo, T. (Autor:in) / Adachi, K. (Autor:in) / Fukuda, K. (Autor:in)
MATERIALS SCIENCE FORUM ; 457/460 ; 1397-1400
01.01.2004
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Radiation Response of p-Channel 6H-SiC MOSFETs Fabricated Using Pyrogenic Conditions
British Library Online Contents | 2002
|Controlling Characteristics of 4H-SiC(0001) p-Channel MOSFETs Fabricated on Ion-Implanted n-Well
British Library Online Contents | 2012
|1.4kV Double-Implanted MOSFETs Fabricated on 4H-SiC(000-1)
British Library Online Contents | 2011
|British Library Online Contents | 2004
|Monitoring pyrogenic processes
Elsevier | 1991