SIMS depth profile analysis of sodium in silicon dioxide

Yamamoto, Y. / Shimodaira, N. | British Library Online Contents | 2008

Accurate SIMS depth profiling for ultra-shallow implants using backside SIMS

Hongo, C. / Tomita, M. / Takenaka, M. et al. | British Library Online Contents | 2003

Characterization of polymer solar cells by TOF-SIMS depth profiling

Bulle-Lieuwma, C. W. / van Gennip, W. J. / van Duren, J. K. et al. | British Library Online Contents | 2003

SIMS depth profiling and TEM imaging of the SIMS altered layer

Christofi, A. / Walker, J. F. / McPhail, D. S. | British Library Online Contents | 2008

TOF-SIMS depth profiling of SIMON

Xin, G. / Dong, G. / Xu, C. et al. | British Library Online Contents | 2003