Ion-, photoelectron- and laser-assisted analytical investigation of nano-structured mixed HfO2-SiO2 and ZrO2-SiO2 thin films

Armelao, L. / Bleiner, D. / Di Noto, V. et al. | British Library Online Contents | 2005

X-ray photoelectron spectroscopy characterisation of high-k dielectric Al2O3 and HfO2 layers deposited on SiO2/Si surface

Vitchev, R. G. / Pireaux, J. J. / Conard, T. et al. | British Library Online Contents | 2004

Optical properties of the Al2O3/SiO2 and Al2O3/HfO2/SiO2 antireflective coatings

Marszałek, K. / Winkowski, P. / Jaglarz, J. | British Library Online Contents | 2014

Interlayer analysis of HfO2/SiO2/Si by SIMS and HRBS

Sasakawa, K. / Fujikawa, K. / Toyoda, T. | British Library Online Contents | 2008

Density-functional theory molecular dynamics simulations of a-HfO2/a-SiO2/SiGe and a-HfO2/a-SiO2/Ge with a-SiO2 and a-SiO suboxide interfacial layers

Chagarov, Evgueni A. / Kavrik, Mahmut S. / Fang, Ziwei et al. | British Library Online Contents | 2018