Stress determination in strained-Si grown on ultra-thin SiGe virtual substrates

Perova, T. S. / Lyutovich, K. / Kasper, E. et al. | British Library Online Contents | 2006

Raman study of strained SiGe layers

Gu, S. / Zhang, R. / Han, P. et al. | British Library Online Contents | 1994

Reliability study of ultra-thin gate oxides on strained-Si/SiGe MOS structures

Varzgar, J. B. / Kanoun, M. / Uppal, S. et al. | British Library Online Contents | 2006

The characteristic of HfO2 on strained SiGe

Chen, T. C. / Lee, L. S. / Lai, W. Z. et al. | British Library Online Contents | 2005

Optical anisotropies in strained Si/SiGe systems

Olajos, J. / Engvall, J. / Grimmeiss, H. G. et al. | British Library Online Contents | 1996