XRD analysis of strained Ge-SiGe heterostructures on relaxed SiGe graded buffers grown by hybrid epitaxy on Si(001) substrates

Franco, N. / Barradas, N. P. / Alves, E. et al. | British Library Online Contents | 2005

Reliability study of ultra-thin gate oxides on strained-Si/SiGe MOS structures

Varzgar, J. B. / Kanoun, M. / Uppal, S. et al. | British Library Online Contents | 2006

Formation of thin SiGe virtual substrates by ion implantation into Si substrates

Sawano, K. / Koh, S. / Hirose, Y. et al. | British Library Online Contents | 2004

A high throughput, ultra-low roughness, SiGe-free strained Si regrowth process

Leitz, C. / Yang, V. / Carroll, M. et al. | British Library Online Contents | 2005

Raman study of strained SiGe layers

Gu, S. / Zhang, R. / Han, P. et al. | British Library Online Contents | 1994