Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Intermetallic Compound Formation and Growth Kinetics in Flip Chip Joints Using Sn-3.0Ag-0.5Cu Solder and Ni-P under Bump Metallurgy
Intermetallic Compound Formation and Growth Kinetics in Flip Chip Joints Using Sn-3.0Ag-0.5Cu Solder and Ni-P under Bump Metallurgy
Intermetallic Compound Formation and Growth Kinetics in Flip Chip Joints Using Sn-3.0Ag-0.5Cu Solder and Ni-P under Bump Metallurgy
Kim, D.-G. (Autor:in) / Jung, S.-B. (Autor:in)
MATERIALS TRANSACTIONS ; 46 ; 1295-1300
01.01.2005
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Characterization of Co–Sn intermetallic compounds in Sn–3.0Ag–0.5Cu–0.5Co lead-free solder alloy
British Library Online Contents | 2008
|Hardness profiles of Sn-3.0Ag-0.5Cu-TiO2 composite solder by nanoindentation
British Library Online Contents | 2016
|British Library Online Contents | 2005
|Hardness profiles of Sn-3.0Ag-0.5Cu-TiO2 composite solder by nanoindentation
British Library Online Contents | 2016
|British Library Online Contents | 2012
|