The role of deep level traps in barrier height of 4H-SiC Schottky diode

Zaremba, G. / Adamus, Z. / Jung, W. et al. | British Library Online Contents | 2012

Impact of Interface Traps on Current-Voltage Characteristics of 4H-SiC Schottky-Barrier Diodes

Moghadam, H.A. / Dimitrijev, S. / Han, J.S. | British Library Online Contents | 2014

The Role of Residual Source/Drain Implant Damage Traps on SiC MESFET Drain I-V Characteristics

Adjaye, J. / Mazzola, M. S. / Los, A. V. | British Library Online Contents | 2006

Deep levels in silicon carbide Schottky diodes

Castaldini, A. / Cavallini, A. / Polenta, L. et al. | British Library Online Contents | 2002

Laser gettering of structural-impurity defects in the contacts of metal-intrinsic CdTe with a Schottky barrier

Vorobets, G. I. / Vorobets, O. I. / Strebegev, V. N. et al. | British Library Online Contents | 2007