Classification of stacking faults and dislocations observed in nonpolar a-plane GaN epilayers using transmission electron microscopy

Kong, B. H. / Sun, Q. / Han, J. et al. | British Library Online Contents | 2012

Single Shockley Stacking Faults in As-Grown 4H-SiC Epilayers

Hassan, J. / Bergman, J.P. | British Library Online Contents | 2010

Residual Stresses and Stacking Faults in n-Type 4H-SiC Epilayers

Okojie, R. S. / Zhang, M. / Pirouz, P. | British Library Online Contents | 2004

Impact of Carrier Lifetimes on Non-Destructive Mapping of Dislocations in 4H-SiC Epilayers

Feng, G. / Suda, J. / Kimoto, T. | British Library Online Contents | 2011

Optical and Structural Properties of In-Grown Stacking Faults in 4H-SiC Epilayers

Hassan, J. / Henry, A. / Bergman, J.P. | British Library Online Contents | 2010