Development of Non-Destructive In-House Observation Techniques for Dislocations and Stacking Faults in SiC Epilayers

Kamata, I. / Tsuchida, H. / Miyanagi, T. et al. | British Library Online Contents | 2006

Single Shockley Stacking Faults in As-Grown 4H-SiC Epilayers

Hassan, J. / Bergman, J.P. | British Library Online Contents | 2010

Residual Stresses and Stacking Faults in n-Type 4H-SiC Epilayers

Okojie, R. S. / Zhang, M. / Pirouz, P. | British Library Online Contents | 2004

Basal Plane Dislocations in 4H-SiC Epilayers with Different Dopings

Zhang, X. / Nagano, M. / Tsuchida, H. | British Library Online Contents | 2012

Optical and Structural Properties of In-Grown Stacking Faults in 4H-SiC Epilayers

Hassan, J. / Henry, A. / Bergman, J.P. | British Library Online Contents | 2010