A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Development of Non-Destructive In-House Observation Techniques for Dislocations and Stacking Faults in SiC Epilayers
Development of Non-Destructive In-House Observation Techniques for Dislocations and Stacking Faults in SiC Epilayers
Development of Non-Destructive In-House Observation Techniques for Dislocations and Stacking Faults in SiC Epilayers
Kamata, I. (author) / Tsuchida, H. (author) / Miyanagi, T. (author) / Nakamura, T. (author) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.
2006-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
| British Library Online Contents | 2012
Single Shockley Stacking Faults in As-Grown 4H-SiC Epilayers
| British Library Online Contents | 2010
Residual Stresses and Stacking Faults in n-Type 4H-SiC Epilayers
| British Library Online Contents | 2004
Impact of Carrier Lifetimes on Non-Destructive Mapping of Dislocations in 4H-SiC Epilayers
| British Library Online Contents | 2011
Optical and Structural Properties of In-Grown Stacking Faults in 4H-SiC Epilayers
| British Library Online Contents | 2010