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Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers
Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers
Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers
Wagner, M. (Autor:in) / Mustafa, E. (Autor:in) / Hahn, S. (Autor:in) / Syvajarvi, M. (Autor:in) / Yakimova, R. (Autor:in) / Jang, S. (Autor:in) / Sakwe, S. A. (Autor:in) / Wellmann, P. J. (Autor:in) / Wright, N. / Johnson, C. M.
01.01.2007
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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