Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Ru/WCoCN as a seedless Cu barrier system for advanced Cu metallization
Ru/WCoCN as a seedless Cu barrier system for advanced Cu metallization
Ru/WCoCN as a seedless Cu barrier system for advanced Cu metallization
Perng, D. C. (Autor:in) / Yeh, J. B. (Autor:in) / Hsu, K. C. (Autor:in)
APPLIED SURFACE SCIENCE ; 256 ; 688-692
01.01.2009
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Ultrathin Cr added Ru film as a seedless Cu diffusion barrier for advanced Cu interconnects
British Library Online Contents | 2012
|Advanced multilevel metallization technology
British Library Online Contents | 1996
|British Library Online Contents | 2010
|Ti-diffusion barrier in Cu-based metallization
British Library Online Contents | 1996
|Co-sputtered TiB~2 as a diffusion barrier for advanced microelectronics with Cu metallization
British Library Online Contents | 1996
|