Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Evaluation of 4H-SiC Carbon Face Gate Oxide Reliability
Evaluation of 4H-SiC Carbon Face Gate Oxide Reliability
Evaluation of 4H-SiC Carbon Face Gate Oxide Reliability
Fronheiser, J.A. (Autor:in) / Chatterjee, A. (Autor:in) / Grossner, U. (Autor:in) / Matocha, K. (Autor:in) / Tilak, V. (Autor:in) / Yu, L.C. (Autor:in) / Monakhov, E.V. / Hornos, T. / Svensson, B.G.
01.01.2011
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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