Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Evaluation of 4H-SiC Carbon Face Gate Oxide Reliability

    New search for: Fronheiser, J.A.
    New search for: Chatterjee, A.
    New search for: Grossner, U.
    New search for: Matocha, K.
    New search for: Tilak, V.
    New search for: Yu, L.C.
    New search for: Monakhov, E.V.
    New search for: Hornos, T.
    New search for: Svensson, B.G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Evaluation of 4H-SiC Carbon Face Gate Oxide Reliability

    New search for: Fronheiser, J.A.
    New search for: Chatterjee, A.
    New search for: Grossner, U.
    New search for: Matocha, K.
    New search for: Tilak, V.
    New search for: Yu, L.C.
    New search for: Monakhov, E.V.
    New search for: Hornos, T.
    New search for: Svensson, B.G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Evaluation of 4H-SiC Carbon Face Gate Oxide Reliability

    New search for: Fronheiser, J.A.
    New search for: Chatterjee, A.
    New search for: Grossner, U.
    New search for: Matocha, K.
    New search for: Tilak, V.
    New search for: Yu, L.C.
    New search for: Monakhov, E.V.
    New search for: Hornos, T.
    New search for: Svensson, B.G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Evaluation of 4H-SiC Carbon Face Gate Oxide Reliability

    Contributors:

    Fronheiser, J.A. (author) / Chatterjee, A. (author) / Grossner, U. (author) / Matocha, K. (author) / Tilak, V. (author) / Yu, L.C. (author) / Monakhov, E.V. / Hornos, T. / Svensson, B.G.

    Published in:

    Silicon Carbide and Related Materials 2010 ; 354-357

    MATERIALS SCIENCE FORUM ; 679/680

    Publication date:

    2011-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Impact of Carbon Cap Annealing on Gate Oxide Reliability on 4H-SiC (000-1) C-Face

    Harada, S. / Kato, M. / Ito, S. et al. | British Library Online Contents | 2009

    Reliability of Large-Area Gate Oxide on the C-Face of 4H-SiC

    Hatakeyama, T. / Kono, H. / Suzuki, T. et al. | British Library Online Contents | 2009

    Ultra thin gate oxide reliability enhanced by carbon contamination free process

    Iwamoto, T. / Ohmi, T. | British Library Online Contents | 1997

    Gate Oxide Long-Term Reliability of 4H-SiC MOS Devices

    Yu, L.C. / Cheung, K.P. / Dunne, G. et al. | British Library Online Contents | 2010

    Impact of Oxidation Conditions and Surface Defects on the Reliability of Large-Area Gate Oxide on the C-Face of 4H-SiC

    Hatakeyama, T. / Suzuki, T. / Ichinoseki, K. et al. | British Library Online Contents | 2010

    Back to top