Classification of stacking faults and dislocations observed in nonpolar a-plane GaN epilayers using transmission electron microscopy: Fid-Bau Portal

Classification of stacking faults and dislocations observed in nonpolar a-plane GaN epilayers using transmission electron microscopy

Kong, B. H. / Sun, Q. / Han, J. / Lee, I. H. / Cho, H. K.

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Classification of stacking faults and dislocations observed in nonpolar a-plane GaN epilayers using transmission electron microscopy

Kong, B. H. / Sun, Q. / Han, J. / Lee, I. H. / Cho, H. K.

Classification of stacking faults and dislocations observed in nonpolar a-plane GaN epilayers using transmission electron microscopy

Kong, B. H. / Sun, Q. / Han, J. / Lee, I. H. / Cho, H. K.

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Check availability in my library

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Document information

Title:

Classification of stacking faults and dislocations observed in nonpolar a-plane GaN epilayers using transmission electron microscopy

Contributors:

Kong, B. H. (author) / Sun, Q. (author) / Han, J. (author) / Lee, I. H. (author) / Cho, H. K. (author)

Published in:

APPLIED SURFACE SCIENCE ; 258 ; 2522-2528

Publication date:

2012-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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