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X-Ray Measurement of Residual Stress Distribution in Sputtered Cu Thin Films
X-Ray Measurement of Residual Stress Distribution in Sputtered Cu Thin Films
X-Ray Measurement of Residual Stress Distribution in Sputtered Cu Thin Films
Akiniwa, Y. (Autor:in) / Sakaue, T. (Autor:in) / Chandra, T. / Ionescu, M. / Mantovani, D.
01.01.2012
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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