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Suppressing the growth of interfacial Cu–Sn intermetallic compounds in the Sn–3.0Ag–0.5Cu–0.1Ni/Cu–15Zn solder joint during thermal aging
Suppressing the growth of interfacial Cu–Sn intermetallic compounds in the Sn–3.0Ag–0.5Cu–0.1Ni/Cu–15Zn solder joint during thermal aging
Suppressing the growth of interfacial Cu–Sn intermetallic compounds in the Sn–3.0Ag–0.5Cu–0.1Ni/Cu–15Zn solder joint during thermal aging
Chen, W. Y. (Autor:in) / Yu, C. Y. (Autor:in) / Duh, J. G. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 47 ; 4012-4018
01.01.2012
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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