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    X-ray diffraction studies and ellipsometric diagnostic of thin -Ti growth films in plasma activated physical vapour deposition

    New search for: Wulff, H.
    New search for: Steffen, H.
    New search for: Krasemann, V.
    New search for: Klimke, J.

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    X-ray diffraction studies and ellipsometric diagnostic of thin -Ti growth films in plasma activated physical vapour deposition

    New search for: Wulff, H.
    New search for: Steffen, H.
    New search for: Krasemann, V.
    New search for: Klimke, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    X-ray diffraction studies and ellipsometric diagnostic of thin -Ti growth films in plasma activated physical vapour deposition

    New search for: Wulff, H.
    New search for: Steffen, H.
    New search for: Krasemann, V.
    New search for: Klimke, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    X-ray diffraction studies and ellipsometric diagnostic of thin -Ti growth films in plasma activated physical vapour deposition

    Contributors:

    Wulff, H. (author) / Steffen, H. (author) / Krasemann, V. (author) / Klimke, J. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 313

    Publication date:

    1994-01-01

    Size:

    313 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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