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Electrical Characterization of Metastable Defects Introduced in GaN by Eu-Ion Implantation
Electrical Characterization of Metastable Defects Introduced in GaN by Eu-Ion Implantation
Electrical Characterization of Metastable Defects Introduced in GaN by Eu-Ion Implantation
Auret, F.D. (author) / Meyer, W.E. (author) / Diale, M. (author) / Van Rensburg, P.J.J. (author) / Song, S.F. (author) / Temst, K. (author) / Vantomme, A. (author) / Monakhov, E.V. / Hornos, T. / Svensson, B.G.
2011-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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