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    Thickness dependence of microstructural evolution of ZnO films deposited by rf magnetron sputtering

    New search for: Yong Eui Lee
    New search for: Young Jin Kim
    New search for: Hyeong Joon Kim

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    Thickness dependence of microstructural evolution of ZnO films deposited by rf magnetron sputtering

    New search for: Yong Eui Lee
    New search for: Young Jin Kim
    New search for: Hyeong Joon Kim

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thickness dependence of microstructural evolution of ZnO films deposited by rf magnetron sputtering

    New search for: Yong Eui Lee
    New search for: Young Jin Kim
    New search for: Hyeong Joon Kim

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Thickness dependence of microstructural evolution of ZnO films deposited by rf magnetron sputtering

    Contributors:

    Yong Eui Lee (author) / Young Jin Kim (author) / Hyeong Joon Kim (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 13 ; 1260-1265

    Publication date:

    1998-01-01

    Size:

    6 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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