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A phase field model for failure in interconnect lines due to coupled diffusion mechanisms

Bhate, D. N. / Bower, A. F. / Kumar, A.

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A phase field model for failure in interconnect lines due to coupled diffusion mechanisms

Bhate, D. N. / Bower, A. F. / Kumar, A.

A phase field model for failure in interconnect lines due to coupled diffusion mechanisms

Bhate, D. N. / Bower, A. F. / Kumar, A.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

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Document information

Title:

A phase field model for failure in interconnect lines due to coupled diffusion mechanisms

Contributors:

Bhate, D. N. (author) / Bower, A. F. (author) / Kumar, A. (author)

Published in:

JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS ; 50 ; 2057-2083

Publication date:

2002-01-01

Size:

27 pages

ISSN:

0022-5096

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 530 / 620

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