The advantages of normal incidence ultra-low energy secondary ion mass spectrometry depth profiling: Fid-Bau Portal

The advantages of normal incidence ultra-low energy secondary ion mass spectrometry depth profiling

Ormsby, T.J. / Chu, D.P. / Dowsett, M.G. / Cooke, G.A. / Patel, S.B.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

The advantages of normal incidence ultra-low energy secondary ion mass spectrometry depth profiling

Ormsby, T.J. / Chu, D.P. / Dowsett, M.G. / Cooke, G.A. / Patel, S.B.

The advantages of normal incidence ultra-low energy secondary ion mass spectrometry depth profiling

Ormsby, T.J. / Chu, D.P. / Dowsett, M.G. / Cooke, G.A. / Patel, S.B.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

The advantages of normal incidence ultra-low energy secondary ion mass spectrometry depth profiling

Contributors:

Ormsby, T.J. (author) / Chu, D.P. (author) / Dowsett, M.G. (author) / Cooke, G.A. (author) / Patel, S.B. (author)

Published in:

APPLIED SURFACE SCIENCE ; 144 ; 292-296

Publication date:

1999-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Dowsett, M. G. | British Library Online Contents | 2003

Sputter depth profiling by secondary ion mass spectrometry coupled with sample current measurements

Bardi, U. / Chenakin, S. P. / Lavacchi, A. et al. | British Library Online Contents | 2006

Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

Mahoney, C. M. / Fahey, A. J. / Gillen, G. et al. | British Library Online Contents | 2006

Deuterium concentration depth profiling in sputter-deposited tungsten coated F82H using secondary ion mass spectrometry

Y. Xu / Y. Hirooka / L.M. Luo et al. | DOAJ | 2019

Free access

Sub-keV secondary ion mass spectrometry depth profiling: comparison of sample rotation and oxygen flooding

Liu, R. / Wee, A. T. S. | British Library Online Contents | 2004