Structural characterization of Si1-xGex/Si strained superlattices and relaxed virtual substrates grown by chemical vapor deposition: Fid-Bau Portal

Structural characterization of Si1-xGex/Si strained superlattices and relaxed virtual substrates grown by chemical vapor deposition

Bozzo, S. / Lazzari, J. L. / Hollander, B. / Coudreau, C. / Ronda, A. / Mantl, S. / D'Avitaya, F. A. / Derrien, J.

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Structural characterization of Si1-xGex/Si strained superlattices and relaxed virtual substrates grown by chemical vapor deposition

Bozzo, S. / Lazzari, J. L. / Hollander, B. / Coudreau, C. / Ronda, A. / Mantl, S. / D'Avitaya, F. A. / Derrien, J.

Structural characterization of Si1-xGex/Si strained superlattices and relaxed virtual substrates grown by chemical vapor deposition

Bozzo, S. / Lazzari, J. L. / Hollander, B. / Coudreau, C. / Ronda, A. / Mantl, S. / D'Avitaya, F. A. / Derrien, J.

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Document information

Title:

Structural characterization of Si1-xGex/Si strained superlattices and relaxed virtual substrates grown by chemical vapor deposition

Contributors:

Bozzo, S. (author) / Lazzari, J. L. (author) / Hollander, B. (author) / Coudreau, C. (author) / Ronda, A. (author) / Mantl, S. (author) / D'Avitaya, F. A. (author) / Derrien, J. (author)

Published in:

APPLIED SURFACE SCIENCE ; 164 ; 35-41

Publication date:

2000-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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Tsujino, S. / Mentese, S. / Diehl, L. et al. | British Library Online Contents | 2004