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Structural characterization of Si1-xGex/Si strained superlattices and relaxed virtual substrates grown by chemical vapor deposition
Structural characterization of Si1-xGex/Si strained superlattices and relaxed virtual substrates grown by chemical vapor deposition
Structural characterization of Si1-xGex/Si strained superlattices and relaxed virtual substrates grown by chemical vapor deposition
Bozzo, S. (author) / Lazzari, J. L. (author) / Hollander, B. (author) / Coudreau, C. (author) / Ronda, A. (author) / Mantl, S. (author) / D'Avitaya, F. A. (author) / Derrien, J. (author)
APPLIED SURFACE SCIENCE ; 164 ; 35-41
2000-01-01
7 pages
Article (Journal)
English
DDC:
621.35
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