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Aluminum chemical vapor deposition reaction of dimethylaluminum hydride on TiN studied by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry
Aluminum chemical vapor deposition reaction of dimethylaluminum hydride on TiN studied by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry
Aluminum chemical vapor deposition reaction of dimethylaluminum hydride on TiN studied by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry
Tanaka, K. (author) / Yanashima, H. (author) / Yako, T. (author) / Kamio, K. (author) / Sugai, K. (author) / Kishida, S. (author)
APPLIED SURFACE SCIENCE ; 171 ; 71-81
2001-01-01
11 pages
Article (Journal)
English
DDC:
621.35
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