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Electrical characterization of low temperature deposited TiO2 films on strained-SiGe layers
Electrical characterization of low temperature deposited TiO2 films on strained-SiGe layers
Electrical characterization of low temperature deposited TiO2 films on strained-SiGe layers
Dalapati, G. K. (author) / Chatterjee, S. (author) / Samanta, S. K. (author) / Maiti, C. K. (author)
APPLIED SURFACE SCIENCE ; 210 ; 249-254
2003-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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