Electrical characterization of charges in irradiated oxides by electrostatic force microscopy and Kelvin method: Fid-Bau Portal

Electrical characterization of charges in irradiated oxides by electrostatic force microscopy and Kelvin method

Dongmo, H. / Carlotti, J. F. / Bruguier, G. / Guasch, C. / Bonnet, J. / Gasiot, J.

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Electrical characterization of charges in irradiated oxides by electrostatic force microscopy and Kelvin method

Dongmo, H. / Carlotti, J. F. / Bruguier, G. / Guasch, C. / Bonnet, J. / Gasiot, J.

Electrical characterization of charges in irradiated oxides by electrostatic force microscopy and Kelvin method

Dongmo, H. / Carlotti, J. F. / Bruguier, G. / Guasch, C. / Bonnet, J. / Gasiot, J.

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Check availability in my library

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Document information

Title:

Electrical characterization of charges in irradiated oxides by electrostatic force microscopy and Kelvin method

Contributors:

Dongmo, H. (author) / Carlotti, J. F. (author) / Bruguier, G. (author) / Guasch, C. (author) / Bonnet, J. (author) / Gasiot, J. (author)

Published in:

APPLIED SURFACE SCIENCE ; 212-213 ; 607-613

Publication date:

2003-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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