A platform for research: civil engineering, architecture and urbanism
On the mechanism of ion-implanted As diffusion in relaxed SiGe
On the mechanism of ion-implanted As diffusion in relaxed SiGe
On the mechanism of ion-implanted As diffusion in relaxed SiGe
Eguchi, S. (author) / Lee, J. J. (author) / Rhee, S. J. (author) / Kwong, D. L. (author) / Lee, M. L. (author) / Fitzgerald, E. A. (author) / Aberg, I. (author) / Hoyt, J. L. (author)
APPLIED SURFACE SCIENCE ; 224 ; 59-62
2004-01-01
4 pages
Article (Journal)
English
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Boron diffusion in strained and strain-relaxed SiGe
British Library Online Contents | 2005
|Wafer bonding involving strain-relaxed SiGe
British Library Online Contents | 2005
|Phosphorus diffusion in the presence of threading dislocations in strain relaxed SiGe films
British Library Online Contents | 2006
|Compressively strained Ge channels on relaxed SiGe buffer layers
British Library Online Contents | 2003
|Relaxed SiGe-on-insulator fabricated by dry oxidation of sandwiched Si/SiGe/Si structure
British Library Online Contents | 2005
|