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Residual Stresses and Stacking Faults in n-Type 4H-SiC Epilayers
Residual Stresses and Stacking Faults in n-Type 4H-SiC Epilayers
Residual Stresses and Stacking Faults in n-Type 4H-SiC Epilayers
Okojie, R. S. (author) / Zhang, M. (author) / Pirouz, P. (author)
MATERIALS SCIENCE FORUM ; 457/460 ; 529-532
2004-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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