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Boron interaction with extended defects induced by He-H co-implantation in Si
Boron interaction with extended defects induced by He-H co-implantation in Si
Boron interaction with extended defects induced by He-H co-implantation in Si
Gaudin, G. (author) / Cayrel, F. (author) / Bongiorno, C. (author) / Jerisian, R. (author) / Dubois, C. (author) / Raineri, V. (author) / Alquier, D. (author)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 124-125 ; 266-270
2005-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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