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Optical emission spectroscopy investigation of sputtering discharge used for SiOxNy thin films deposition and correlation with the film composition
Optical emission spectroscopy investigation of sputtering discharge used for SiOxNy thin films deposition and correlation with the film composition
Optical emission spectroscopy investigation of sputtering discharge used for SiOxNy thin films deposition and correlation with the film composition
Rebib, F. (author) / Tomasella, E. (author) / Thomas, L. (author) / Cellier, J. (author) / Sauvage, T. (author) / Jacquet, M. (author)
APPLIED SURFACE SCIENCE ; 252 ; 5611-5614
2006-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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