Electrical activity of dislocations in epitaxial ZnO- and GaN-layers analyzed by holography in a transmission electron microscope: Fid-Bau Portal

Electrical activity of dislocations in epitaxial ZnO- and GaN-layers analyzed by holography in a transmission electron microscope

Muller, E. / Gerthsen, D. / Bruckner, P. / Scholz, F. / Kirchner, C. / Waag, A.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Electrical activity of dislocations in epitaxial ZnO- and GaN-layers analyzed by holography in a transmission electron microscope

Muller, E. / Gerthsen, D. / Bruckner, P. / Scholz, F. / Kirchner, C. / Waag, A.

Electrical activity of dislocations in epitaxial ZnO- and GaN-layers analyzed by holography in a transmission electron microscope

Muller, E. / Gerthsen, D. / Bruckner, P. / Scholz, F. / Kirchner, C. / Waag, A.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Electrical activity of dislocations in epitaxial ZnO- and GaN-layers analyzed by holography in a transmission electron microscope

Contributors:

Muller, E. (author) / Gerthsen, D. (author) / Bruckner, P. (author) / Scholz, F. (author) / Kirchner, C. (author) / Waag, A. (author)

Published in:

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 9 ; 127-131

Publication date:

2006-01-01

Size:

5 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

Simoen, E. / Brouwers, G. / Eneman, G. et al. | British Library Online Contents | 2008

Transmission electron microscope observations of dislocations in heteroepitaxial layers of CdTe-(CdHg)Te on GaAs

Patriarche, G. / Girard-Francois, A. / Riviere, J.-P. et al. | British Library Online Contents | 1997

Simulation of Transmission Electron Microscope Images of Dislocations Pinned by Obstacles

Satoh, Y. / Hatano, T. / Nita, N. et al. | British Library Online Contents | 2014

Investigation of In-Grown Dislocations in 4H-SiC Epitaxial Layers

Kojima, K. / Kato, T. / Kuroda, S. et al. | British Library Online Contents | 2006

Differences in Emission Spectra of Dislocations in 4H-SiC Epitaxial Layers

Liu, K.X. / Zhang, X. / Stahlbush, R.E. et al. | British Library Online Contents | 2009