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The analysis of structural and electronic environments of silicon network in HWCVD deposited a-SiC:H films
The analysis of structural and electronic environments of silicon network in HWCVD deposited a-SiC:H films
The analysis of structural and electronic environments of silicon network in HWCVD deposited a-SiC:H films
Swain, B. P. (author)
APPLIED SURFACE SCIENCE ; 253 ; 8695-8698
2007-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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